Wednesday 4/30/14: Morning Sessions
7:30 a.m.	Breakfast
	TEST INFRASTRUCTURE AND PRODUCTION	MIXED SIGNAL	RF WIRELESS	DIGITAL	POWER MGMT / AUTOMOTIVE	MEMORY
8:30 a.m.	Panel Discussion - Imagine the Future of Test
10:00 a.m.	Break
10:30 a.m.	Getting a Head-Start on Converting IG-XL Programs into ETS-800 MST Programs   (140)	HDCTO vs. MSO – Emerging Competition in the AC / Mixed Signal League  (102)	Measuring Noise Figure for RF Receivers Using UltraFLEX UltraWave12G Receiver (43)	Implementing Sflash Protocol Aware Characterization (132)	PVI for Power/Automotive Testing: Optimizing Test for Production Environment  (16)	Memory Testing on IP750 Using Image Processing  (151)
11:00 a.m.	New Instrument Customer Evaluation (NICE) Flow  (62)	DC Trend Removal by DSP-based Analysis on DAC Testing  (57)	SerDes Testing Beyond 15GBps (30)	Using DSIO to Measure Frequency on J750  (137)	High-Voltage Detect Tool to Avoid HSD Gripen Circuit Damage  (10)	Using TEC Save to Find a Data Valid Window During Synchronous Tests  (125)
11:30 a.m.	Online Stability Study Tool  (79)	Encoding and Decoding a Sine Signal for PCS 10base-G 64b66b Standard  (71)	Probe Card Design Guidelines for Test Concurrency on RF Connectivity Devices  (37)	Rise/Fall Time Measurements on J750Ex-HD  (112)	Test Time Reduction: Our Story (115)	Massively Parallel Parametric Go/No Go Tests with Measured Results Sampling  (111)
12:00 p.m.	Lunch
Wednesday 4/30/14: Afternoon Sessions
	TEST INFRASTRUCTURE AND PRODUCTION	DIGITAL	RF WIRELESS	DIGITAL	POWER MGMT / AUTOMOTIVE	MEMORY
1:00 p.m.	Probe Card Supernova! Best Practices and Lessons Learned to Avoid Burnt Needles  (67)	Analytical Approach to Loadboard Design  (141)	ESA Programming Overview & Test Time Reduction Methods (173)	How to Optimize High Parallel Digital Test Programs  (105)	Testing Power Modules and Smart Power Modules with New ETS Test System  (68)	KGD Memory Testing at 2.133Gbps  (117)
1:30 p.m.	ETS-364 Eagle Vision/ETS-88-MST/ETS-800-MST Upgrade Process for Windows 7 Offline Systems  (5)	Signal Integrity (150)		Speeding up Test Programs for High Site Counts on J750Ex-HD  (120)	Understanding Index Parallel Testing  (144)	Advanced Shmoo Features on Magnum  (116)
2:00 p.m.		Testing High Current Switch Devices with Ganging 10 HexVS Supplies  (143)		The Benefits and Use Model for Concurrent Pattern Testing on the J750Ex-HD  (127)		Controlling Voltages in a Pattern on the Nextest Magnum I (152)
2:30 p.m.		Comparing UltraPin1600 HRAM, CMEM and DSSC Digital Capture (72)	Effect of DC Supplies on RF Transient Response (171)	Application of Auto Strobe and DIB Access in J750Ex-HD (74)		Even Parity Subroutines Are Reusable for Your Embedded ARM!  (122)
3:30 p.m.						Building Your Own Tester GUI For The ARM Debug Access Port  (123)
4:00 p.m.	Survivor Party